Journalartikel - Wissenschaftlicher Artikel | 2022 | Peer reviewed

Purely Spectrometric Method to Measure the Bias Refractive Index Including its Dispersion and the Swelling or Shrinking of Holographic Materials

Autor*innen

Altmeyer, Stefan ; Matrisch, Jan Henning ; Bauer, Niklas Frederik ; Frensch, M.

Zeitschrift

Journal of the Optical Society of America

DOI

10.1364/JOSAB.443976

Weitere Details

Sprache

englisch

Darstellungsform

Text

Band

Ausgabe

Seitenbereich

444 - 451

Zitierstile

Altmeyer, S., Matrisch, J. H., Bauer, N. F., & Frensch, M. (2022). Purely Spectrometric Method to Measure the Bias Refractive Index Including its Dispersion and the Swelling or Shrinking of Holographic Materials. Journal of the Optical Society of America, 39(2), 444–451. doi:10.1364/JOSAB.443976

In die Zwischenablage kopieren

Altmeyer, S., Matrisch, J.H., Bauer, N.F. and Frensch, M., 2022. Purely Spectrometric Method to Measure the Bias Refractive Index Including its Dispersion and the Swelling or Shrinking of Holographic Materials. Journal of the Optical Society of America, 39(2), pp.444–451.

In die Zwischenablage kopieren

Altmeyer, Stefan u. a. 2022. Purely Spectrometric Method to Measure the Bias Refractive Index Including its Dispersion and the Swelling or Shrinking of Holographic Materials. Journal of the Optical Society of America 39, 2, 444–451.

American Psychological Association 6th edition (DOI)

Anglia Ruskin University - Harvard

Gesellschaft für Bildung und Forschung in Europa - Harvard